| 000 -LEADER |
|---|
| fixed length control field |
00786nam a22001931a 4500 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
109812778810 |
| Terms of availability |
0.00 |
| 021 ## - |
|---|
| -- |
109812778810 |
| -- |
0.00 |
| 040 ## - CATALOGING SOURCE |
|---|
| Original cataloging agency |
Pandit Deendayal Petroleum Univesity |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
621.39732 |
| 100 ## - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Nakamura, Takashi |
| 245 ## - TITLE STATEMENT |
|---|
| Title |
Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices |
| Designation of section section/part/series: (SE) [OBSOLETE] |
by Takashi Nakamura, Mamoru Baba, Eishi Ibe, Yasuo Yahagi and Hideaki Kameyama |
| -- |
[Text] |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
|---|
| Place of publication, distribution, etc. |
New Jersey |
| Name of publisher, distributor, etc. |
World Scientific |
| Date of publication, distribution, etc. |
2008 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
343p |
| 700 ## - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Kameyama, Hideaki |
| 700 ## - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Baba, Mamoru |
| 700 ## - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Yahagi, Yasuo |
| 700 ## - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Ibe, Eishi |
| 995 ## - RECOMMENDATION 995 [LOCAL, UNIMARC FRANCE] |
|---|
| -- |
NAK |
| -- |
000643 |
| -- |
BKM-BKM |
| -- |
3499.00 |
| -- |
0 |
| -- |
049 |
| -- |
196 |
| -- |
0 |
| -- |
0.00 |
| -- |
20110104 |
| -- |
C |
| -- |
20110205 |
| -- |
Apollo Book Distributors |
| -- |
General |
