Pandit Deendayal Energy University Library Resource Centre Online Catalogue

Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products

By: Bowen, W RichardContributor(s): Hilal, NidalPublisher: New York Elsevier 2009Description: 283pISBN: 9781856175173DDC classification: 660
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Item type Home library Collection Call number Status Date due Barcode Item holds
Reference Reference SOET Library
Reference 660 ATO (Browse shelf) Available T0007742
Total holds: 0

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