Statistical Analysis and Modelling of Spatial Point Patterns
Publisher: New York John Wiley and Sons, Inc 2008Description: 535pISBN: 9780470014912DDC classification: 519.5| Item type | Home library | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Reference
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SOET Library | Mathematical Eng. | 519.5 ILL (Browse shelf) | Available | T0006820 |
Total holds: 0
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