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Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products

By: Bowen, W RichardContributor(s): Hilal, NidalPublisher: New York Elsevier 2009Description: 283pISBN: 9781856175173DDC classification: 660

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Item type	Home library	Collection	Call number	Status	Date due	Barcode	Item holds
Reference	SOET Library	Reference	660 ATO (Browse shelf)	Available		T0007742

Total holds: 0

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Previous	629.892 SIC Advances in Control of Articulated and Mobile Robots	629.895 IKO Advanced Process Identifications and Control	658.23 HER Facilities Design	660 ATO Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products	660.1518 ELN Numerical Techniques for Chemical and Biological Engineers Using MATLAB: A Simple Bifurcation Approach	660.281 LUY Process Modeling, Simulation and Control for Chemical Engineers	660.2842 SOL Solvent Extraction and Liquid Memberanes: Fundamentals and Applications in New Materials	Next