Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices
Publisher: New Jersey World Scientific 2008Description: 343pISBN: 109812778810DDC classification: 621.39732Item type | Home library | Collection | Call number | Status | Notes | Date due | Barcode | Item holds |
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General Books | SOT Library | Solar Energy (Energy Systems) | 621.39732 NAK (Browse shelf) | Recommended Book | Books Transfer from SSE to SOT (E0014946-E0015166(S0000001-S0000221) | E0015004 |
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621.38152 TU, Electronic Thin-film Reliability | 621.3815422 GE, Transflective Liquid Crystal Displays | 621.381548 ELE Electronic Measurements and Instrumentation | 621.39732 NAK Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices | 621.4 FRE Renewable Energy in Power Systems | 621.4021 CEN Thermodynamics: An Engineering Approach | 621.4021 CEN Thermodynamics: An Engineering Approach |
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